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Title

Sample holder device for studying interfaces by means of transmission mode x-ray diffraction

Other TitlesDispositivo portamuestras para el estudio de interfaces mediante difracción de rayos X en modo transmisión
AuthorsCastro Arroyo, Miguel Ángel ; Medina, Santiago; Pavón, Esperanza ; Orta, M. Mar ; Alba, María D. ; Millán, Carmen
Issue Date23-Jun-2011
CitationWO2011073471 A1
Abstract[ES] Dispositivo portamuestras para el estudio de interfaces mediante difracción de rayos x en modo transmisión configurado para realizar medidas de difracción en modo transmisión para cámaras de temperatura en equipos de difracción de rayos X, para muestras pulverulentas disponibles en modo comercial que se caracteriza porque comprende un cuerpo esencialmente en forma de "T" invertida (lA,! B, lC)l en donde el cuerpo central (lC) comprende, a su vez, en su parte frontal un orificio (2) configurado para la introducción de un termopar, así como dos ventanas (3,4); estando además la primera ventana superior (3) configurada para la introducción de muestras y la segunda ventana lateral (4) configurada para la alineación espacial vertical de la muestra mediante la alineación del haz de la propia cámara.
[EN] The invention relates to a sample holder device for studying interfaces by means of transmission mode X-ray diffraction, said device being designed in such a way that it can take transmission mode diffraction measurements of cornmercially available powdery samples in X-ray diffraction equipment. The device is characterised in that it comprises a body essentially in an inverted T shape (lA,lB, 1 C), wherein the front part of the central body (lC) comprises, in turn, an opening (2) designed for the introduction of a thennocouple, and two windows (3, 4). The first, upper window (3) is designed for the introduction of samples and the second, lateral window (4) is designed for the vertical spatial alignment of the sample by means of the alignment of the beam of the chamber itself.
URIhttp://hdl.handle.net/10261/41384
Appears in Collections:(ICMS) Patentes
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