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PIXE/RBS as a tool to study cementitious materials: Application to the dynamic leaching of concrete

AuthorsLlorente, I.; Castellote, M.; González-Arrabal, Raquel ; Ynsa, M. D.; Muñoz-Martín, A. ; Viedma, P. G. de; Castillo, Andrea P.; Martínez Sierra, Isabel; Andrade, C.; Zuloaga, P.; Ordoñez, M.
KeywordsConcrete leaching
Depth profiling
Issue DateDec-2009
CitationNuclear Instruments and Methods in Physics Research - Section B 267(23-24): 3670-3674 (2009)
Abstract[EN] The suitability of the application of Ion Beam Analysis (IBA) techniques such as Particle Induced X-ray Emission spectrometry (PIXE) and Rutherford Backscattering Spectrometry (RBS) to elemental depth profiling in concrete is analysed, studying hardened samples of concrete prior to and after a dynamic leaching test. A calibration of the data has been done by comparing the results obtained by IBA techniques with those obtained by Chemical and Thermogravimetric Analysis (TG/DTA). From PIXE and RBS data relevant information about the migration of minor elements, within the concrete matrix after leaching is obtained.
Publisher version (URL)http://dx.doi.org/10.1016/j.nimb.2009.09.028
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