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Phase contrast in tapping-mode scanning force microscopy

AuthorsGarcía García, Ricardo ; Tamayo de Miguel, Francisco Javier ; Calleja, Montserrat ; García-Pérez, Fernando
KeywordsTapping-mode operation
Scanning force microscopy
Issue Date1998
CitationApplied Physics - Section A - Materials Science and Processing 66 Supplement 1: S309-S312 (1998)
AbstractThe tapping-mode operation of a scanning force microscope represents an intermediate situation between contact and noncontact regimes. Its rapid development and expansion are due to lateral force minimization and its ability to give phase-contrast images of heterogeneous surfaces. Here, we calculate the phase shift between the cantilever excitation and its response as a function of the sample mechanical properties, tip–sample separation, and adhesion forces. We show that the phase shift that gives rise to phase-contrast images is associated with tip–sample interactions that involve energy dissipation such as adhesion energy hysteresis and viscoelasticity. Experimental phase-shift measurements performed on mica surfaces support the conclusions of the model.
Publisher version (URL)http://dx.doi.org/10.1007/s003390051152
Appears in Collections:(IMN-CNM) Artículos
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