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A BIST solution for frequency domain characterization of analog circuits

AuthorsBarragán, Manuel J. ; Vázquez, Diego ; Rueda, Adoración
KeywordsAnalog BIST
Signal Generator
Frequency Response Characterization
On-Chip Spectrum Analyzer
On-Chip Network Analyzer
Issue Date2010
CitationJournal of Electronic Testing 26(4): 429–441 (2010)
AbstractThis work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It allows a complete characterization in terms of magnitude and phase, including also harmonic distortion and offset measurements. Signal generation is performed using a modified filter, while response evaluation is based on 1storder ÓÄ modulation and very simple digital processing. The signal generator and the response analyzer have been implemented using the Switched-Capacitor (SC) technique in a standard 0.35ìm-3.3V CMOS technology. Both circuits have been separately validated, and an on-board prototype of the complete test system for frequency characterization has been implemented. Experimental results verify the functionality of the proposed approach, and a dynamic range of 70dB@62.5kHz (1MHz clock) has been demonstrated.
DescriptionEl pdf del artículo es la versión post-print.
Publisher version (URL)http://dx.doi.org/10.1007/s10836-010-5158-7
Appears in Collections:(IMSE-CNM) Artículos
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