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Title

Adhesion hysteresis in dynamic atomic force microscopy

AuthorsKöber, Mariana; Sahagún, Enrique; Fuss, Martina ; Briones Fernández-Pola, Fernando ; Luna, Mónica ; Sáenz, J. J.
KeywordsAFM
Hysteresis
Issue Date2-May-2008
PublisherWiley-VCH
CitationPhysica Statatus Solidi (RRL) 2, No. 3, 138–140 (2008)
AbstractThe effects of adhesion hysteresis in the dynamic-dissipation curves measured in amplitude-modulation atomic force microscopy are discussed. Hysteresis in the interaction forces is shown to modify the dynamics of the cantilever leading to different power dissipation curves in the repulsive and attractive regimes. Experimental results together with numerical simulations show that power dissipation, as measured in force microscopy, is not always proportional to the energy dissipated in the tip–sample interaction process.
Publisher version (URL)http://dx.doi.org/10.1002/pssr.200802033
URIhttp://hdl.handle.net/10261/27212
DOI10.1002/pssr.200802033
ISSN1862-6254
Appears in Collections:(IMN-CNM) Artículos
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