Mo-Based Proximity Bilayers for TES: Microstructure and Properties

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Title:	Mo-Based Proximity Bilayers for TES: Microstructure and Properties
Authors:	Fàbrega, Lourdes ; Fernández-Martínez, Iván ; Gil García, Óscar ; Parra-Borderías, María ; Camón, Agustín; Costa Krämer, José Luis ; González-Arrabal, Raquel ; Sesé Monclús, Javier ; Briones Fernández-Pola, Fernando ; Santiso, José ; Peiró, F.
Keywords:	Proximity effect Radiation detectors Stress Transition edge sensors
Issue Date:	Jun-2009
Publisher:	Institute of Electrical and Electronics Engineers
Citation:	IEEE Transactions on Aplied Superconductivity 19(3): 460-464 (2009)
Abstract:	We report on the fabrication and characterization of Mo films, Mo/Au and Mo/Cu bilayers for Transition Edge Sensors (TES). The fabrication conditions (at room temperature) have been varied to achieve layers with the required properties for TES applications. The dependence of their functional properties (i.e. electrical resistivity and superconducting critical temperature) on microstructure (grain size, stress) is investigated.
Publisher version (URL):	http://dx.doi.org/10.1109/TASC.2009.2019052
URI:	http://hdl.handle.net/10261/27117
DOI:	10.1109/TASC.2009.2019052
ISSN:	1051-8223
Appears in Collections:	(IMN-CNM) Artículos

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