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Title

Mo-Based Proximity Bilayers for TES: Microstructure and Properties

AuthorsFàbrega, Lourdes CSIC ORCID; Fernández-Martínez, Iván CSIC; Gil García, Óscar; Parra-Borderías, María CSIC; Camón, Agustín CSIC ORCID ; Costa Krämer, José Luis CSIC ORCID ; González-Arrabal, Raquel CSIC ORCID; Sesé Monclús, Javier; Briones Fernández-Pola, Fernando; Santiso, José CSIC ORCID; Peiró, F.
KeywordsProximity effect
Radiation detectors
Stress
Transition edge sensors
Issue DateJun-2009
PublisherInstitute of Electrical and Electronics Engineers
CitationIEEE Transactions on Aplied Superconductivity 19(3): 460-464 (2009)
AbstractWe report on the fabrication and characterization of Mo films, Mo/Au and Mo/Cu bilayers for Transition Edge Sensors (TES). The fabrication conditions (at room temperature) have been varied to achieve layers with the required properties for TES applications. The dependence of their functional properties (i.e. electrical resistivity and superconducting critical temperature) on microstructure (grain size, stress) is investigated.
Publisher version (URL)http://dx.doi.org/10.1109/TASC.2009.2019052
URIhttp://hdl.handle.net/10261/27117
DOI10.1109/TASC.2009.2019052
ISSN1051-8223
Appears in Collections:(IMN-CNM) Artículos

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