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Mo-Based Proximity Bilayers for TES: Microstructure and Properties

AuthorsFàbrega, Lourdes ; Fernández-Martínez, Iván ; Gil García, Óscar ; Parra-Borderías, María ; Camón, Agustín; Costa Krämer, José Luis ; González-Arrabal, Raquel ; Sesé Monclús, Javier ; Briones Fernández-Pola, Fernando ; Santiso, José ; Peiró, F.
KeywordsProximity effect
Radiation detectors
Transition edge sensors
Issue DateJun-2009
PublisherInstitute of Electrical and Electronics Engineers
CitationIEEE Transactions on Aplied Superconductivity 19(3): 460-464 (2009)
AbstractWe report on the fabrication and characterization of Mo films, Mo/Au and Mo/Cu bilayers for Transition Edge Sensors (TES). The fabrication conditions (at room temperature) have been varied to achieve layers with the required properties for TES applications. The dependence of their functional properties (i.e. electrical resistivity and superconducting critical temperature) on microstructure (grain size, stress) is investigated.
Publisher version (URL)http://dx.doi.org/10.1109/TASC.2009.2019052
Appears in Collections:(IMN-CNM) Artículos
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