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| Title: | Mo-Based Proximity Bilayers for TES: Microstructure and Properties |
Authors: | Fàbrega, Lourdes CSIC ORCID; Fernández-Martínez, Iván CSIC; Gil García, Óscar; Parra-Borderías, María CSIC; Camón, Agustín CSIC ORCID ; Costa Krämer, José Luis CSIC ORCID ; González-Arrabal, Raquel CSIC ORCID; Sesé Monclús, Javier; Briones Fernández-Pola, Fernando; Santiso, José CSIC ORCID; Peiró, F. | Keywords: | Proximity effect Radiation detectors Stress Transition edge sensors |
Issue Date: | Jun-2009 | Publisher: | Institute of Electrical and Electronics Engineers | Citation: | IEEE Transactions on Aplied Superconductivity 19(3): 460-464 (2009) | Abstract: | We report on the fabrication and characterization of Mo films, Mo/Au and Mo/Cu bilayers for Transition Edge Sensors (TES). The fabrication conditions (at room temperature) have been varied to achieve layers with the required properties for TES applications. The dependence of their functional properties (i.e. electrical resistivity and superconducting critical temperature) on microstructure (grain size, stress) is investigated. | Publisher version (URL): | http://dx.doi.org/10.1109/TASC.2009.2019052 | URI: | http://hdl.handle.net/10261/27117 | DOI: | 10.1109/TASC.2009.2019052 | ISSN: | 1051-8223 |
| Appears in Collections: | (IMN-CNM) Artículos |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| briones.pdf | 842,08 kB | Adobe PDF |  View/Open |
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