Performing current versus voltage measurements of single-walled carbon nanotubes using scanning force microscopy

Abstract

In this letter, a method is presented to perform current versus voltage measurements on carbon nanotubes using the tip of a scanning force microscope as an electrode that can be positioned along the molecule. This method allows current versus voltage measurements to be carried out at any spot along a nanotube. By using this method, we present indications of ballistic transport in carbon nanotubes, as well as effects in the electrical properties due to the mechanical deformation. This is a general technique that can be applied to any conducting nanowire.