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Título

Application of back-scattered electron imaging to the study of the lichen-rock interface

AutorAscaso, Carmen ; Wierzchos, Jacek
Palabras claveAspicilia intermutans
Hack-scattered electron scauning
Lichen
Rock
Weatherlug
Fecha de publicación1994
EditorRoyal Microscopical Society (Great Britain)
CitaciónJournal of Microscopy 175 (1):54-59 (1994)
ResumenIn the study of the lichen-rock interface. Light microscopy. scauning electron microscopy (SEM) in secondary emission mode and transmission electron microscopy are the most commonly used techniques. As these methods have some limitations, there is a need to explore other techniques for observation of the lichen-substrate interface. One of the most promising methods is the application of SEM in the back-scattered electron (BSR) emission mode. The thallus of Apiscilia intermutans (Nyl.) Arn. growing on granitic rock was examined by SEM in BSE mode. The detalled preparation of transverse sections of the lichen-rock contact zone is presented. The BSE scanning images of the lichen-rock interface obtained present new insights into the ultrastructural features of the biological components. Providing more information about the biogephysical and biogeochemical weathering of rock.
Descripción6 pages, figures, and tables statistics.
URIhttp://hdl.handle.net/10261/25403
ISSN0022-2720
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