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Application of back-scattered electron imaging to the study of the lichen-rock interface

AuthorsAscaso, Carmen CSIC ORCID ; Wierzchos, Jacek CSIC ORCID
KeywordsAspicilia intermutans
Hack-scattered electron scauning
Issue Date1994
PublisherRoyal Microscopical Society (Great Britain)
CitationJournal of Microscopy 175 (1):54-59 (1994)
AbstractIn the study of the lichen-rock interface. Light microscopy. scauning electron microscopy (SEM) in secondary emission mode and transmission electron microscopy are the most commonly used techniques. As these methods have some limitations, there is a need to explore other techniques for observation of the lichen-substrate interface. One of the most promising methods is the application of SEM in the back-scattered electron (BSR) emission mode. The thallus of Apiscilia intermutans (Nyl.) Arn. growing on granitic rock was examined by SEM in BSE mode. The detalled preparation of transverse sections of the lichen-rock contact zone is presented. The BSE scanning images of the lichen-rock interface obtained present new insights into the ultrastructural features of the biological components. Providing more information about the biogephysical and biogeochemical weathering of rock.
Description6 pages, figures, and tables statistics.
Appears in Collections:(IRN) Artículos

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