Correlative confocal and scanning electron microscopy of cultured cells without using dedicated equipment

Abstract

This protocol enables correlative light and electron microscopy (CLEM) imaging of cell surface features without using dedicated equipment. Cells are cultured and fixed on transparent substrates for confocal microscopy imaging. No conductive coating is employed in the scanning electron microscopy workflow, providing a clean cell surface observation, with fiducial markers assisting alignment of optical and topographical images. This protocol describes CLEM imaging for midbody remnants in MDCK cells but can also be applied to different cell types and surface features.

For complete details on the use and execution of this protocol, please refer to Casares-Arias et al. (2020). https://doi.org/10.1016/j.isci.2020.101244