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Unveiling Planar Defects in Hexagonal Group IV Materials

AuthorsFadaly, Elham M. T.; Marzegalli, Anna; Ren, Yizhen; Sun, Lin; Dijkstra, Alain; Matteis, Diego de; Scalise, Emilio; Sarikov, Andrey; Luca, Marta De; Rurali, Riccardo CSIC ORCID; Zardo, Ilaria; Haverkort, Jos E. M.; Botti, Silvana; Miglio, Leo; Bakkers, Erik P. A. M.
Hexagonal group IV
Hexagonal Ge
Hexagonal Si I3 basal stacking fault
Issue Date28-Apr-2021
PublisherAmerican Chemical Society
CitationNano Letters 21(8): 3619-3625 (2021)
AbstractRecently synthesized hexagonal group IV materials are a promising platform to realize efficient light emission that is closely integrated with electronics. A high crystal quality is essential to assess the intrinsic electronic and optical properties of these materials unaffected by structural defects. Here, we identify a previously unknown partial planar defect in materials with a type I3 basal stacking fault and investigate its structural and electronic properties. Electron microscopy and atomistic modeling are used to reconstruct and visualize this stacking fault and its terminating dislocations in the crystal. From band structure calculations coupled to photoluminescence measurements, we conclude that the I3 defect does not create states within the hex-Ge and hex-Si band gap. Therefore, the defect is not detrimental to the optoelectronic properties of the hex-SiGe materials family. Finally, highlighting the properties of this defect can be of great interest to the community of hex-III-Ns, where this defect is also present.
Publisher version (URL)http://dx.doi.org/10.1021/acs.nanolett.1c00683
Appears in Collections:(ICMAB) Artículos
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