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Título: | Empirical mathematical model of microprocessor sensitivity and early prediction to proton and neutron radiation-induced soft errors |
Autor: | Serrano-Cases, A.; Reyneri, L. M.; Morilla, Yolanda CSIC ORCID; Cuenca-Asensi, Sergio; Martínez-Álvarez, A. | Palabras clave: | Fault tolerance Single event upsets Proton/neutron irradiation effects Soft errors |
Fecha de publicación: | 2020 | Editor: | Institute of Electrical and Electronics Engineers | Citación: | IEEE Transactions on Nuclear Science 67(7): 1511-1520 (2020) | Resumen: | A mathematical model is described to predict microprocessor fault tolerance under radiation. The model is empirically trained by combining data from simulated fault-injection campaigns and radiation experiments, both with protons (at the National Center of Accelerators (CNA) facilities, Seville, Spain) and neutrons [at the Los Alamos Neutron Science Center (LANSCE) Weapons Neutron Research Facility at Los Alamos, USA]. The sensitivity to soft errors of different blocks of commercial processors is identified to estimate the reliability of a set of programs that had previously been optimized, hardened, or both. The results showed a standard error under 0.1, in the case of the Advanced RISC Machines (ARM) processor, and 0.12, in the case of the MSP430 microcontroller. | Versión del editor: | https://doi.org/10.1109/TNS.2020.2993637 | URI: | http://hdl.handle.net/10261/237582 | DOI: | 10.1109/TNS.2020.2993637 | E-ISSN: | 1558-1578 |
Aparece en las colecciones: | (CNA) Artículos |
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empirierrorpost.pdf | 538,69 kB | Adobe PDF | Visualizar/Abrir |
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