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Compositional mapping of surfaces in atomic force microscopy

AuthorsRodríguez, Tomás R.; García García, Ricardo
KeywordsAtomic force microscopy
Mechanical contact
Signal processing
Surface phenomena
Issue Date19-Jan-2004
PublisherAmerican Institute of Physics
CitationApplied Physics Letters 84, 449 (2004)
AbstractWe propose a method for mapping the composition of a surface by using an amplitude modulation atomic force microscope operated without tip-surface mechanical contact. The method consists in exciting the first two modes of the microcantilever. The nonlinear dynamics of the tip motion, the coupling of its first two modes, and the sensitivity of the second mode to long-range attractive forces allows us to use this mode to probe compositional changes while the signal from the first mode is used to image the sample surface. We demonstrate that the second mode has a sensitivity to surface force variations below 10−11 N.
Publisher version (URL)http://link.aip.org
Appears in Collections:(IMN-CNM) Artículos
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