English   español  
Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/23268
Compartir / Impacto:
Estadísticas
Add this article to your Mendeley library MendeleyBASE
Ver citas en Google académico
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Título

APPLYING THE JOINT WIGNER TIME‐FREQUENCY DISTRIBUTION TO CHARACTERIZATION OF TRAIN‐AVERAGE PARAMETERS INHERENT IN THE PULSED LIGHT RADIATION OF SEMICONDUCTOR HETEROLASERS

AutorShcherbakov, Alexandre S.; Moreno Zarate, Pedro; Campos Acosta, Joaquín ; Il'n, Yurij V.; Tarasov, Il'ya S.
Fecha de publicación2009
CitaciónProceedings of SOMI XXIV. Congreso de Instrumentación
ResumenWe present an approach to the characterization of low‐power bright picosecond optical pulses with an internal frequency modulation in both time and frequency domains in practically important cases of exploiting semiconductor heterolasers operating in near‐infrared range in the active mode‐locking regime. This approach uses the joint Wigner time‐frequency distributions, which can be found for this regime due to involving the interferometric technique under consideration. In so doing, the modified scanning Michelson interferometers were chosen for shaping the field‐strength auto‐correlation functions peculiar to the above‐mentioned types of infrared light radiation. We consider in principle the key features of a new experimental technique for accurate and reliable measurements of the coherence interval for continuous‐wave light radiation as well as the train‐average temporal width and the frequency chirp (including its value and sign) associated with picosecond optical pulses in high‐repetition pulse trains. This technique is founded on an ingenious algorithm elaborated specially for the advanced optical metrology, which makes possible constructing the joint Wigner distributions for describing the parameters of light radiation. The InGaAsP/InP‐heterolasers, operating at 1300 nm range, had been exploited during the experiments carried out. In particular, measuring the interval of coherence was initially performed under the continuous‐wave regime of operation for heterolaser structures. These results of our experiments showed that typical auto‐correlation function of the second order inherent in the continuous‐wave semiconductor laser radiation had been characterized by a coherence temporal interval close to 10 ps. Then, when the optical signal consisted of contiguous pulses with the repetition frequency exceeding 1 GHz, due to operating semiconductor laser heterostructures in the active mode‐locking regime, typical pulse train‐average auto‐correlation function had been characterized by a temporal width of about 2‐20 ps. The accuracy of similar measurements increased with growth of the pulse repetition frequency due to rising in a number of samples.
URIhttp://hdl.handle.net/10261/23268
Aparece en las colecciones: (IFA) Comunicaciones congresos
Ficheros en este ítem:
Fichero Descripción Tamaño Formato  
SOMI2009_3.pdf361,69 kBAdobe PDFVista previa
Visualizar/Abrir
Mostrar el registro completo
 


NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.