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Characterization of the time-frequency parameters inherent in the radiation of semiconductor heterolasers using interferometric technique

AutorShcherbakov, Alexandre S.; Moreno Zarate, Pedro; Campos Acosta, Joaquín ; Il'n, Yurij V.; Tarasov, Il'ya
Palabras claveWigner time-frequency distribution
semiconductor heterolaser
pulse parameters
interferometric technique
Fecha de publicación2009
EditorSociety of Photo-Optical Instrumentation Engineers
CitaciónProceedings of Spie
ResumenThe specific approach to characterizing the train-average parameters of low-power picosecond optical pulses with the frequency chirp, arranged in high-repetition-frequency trains, in both time and frequency domains is elaborated for the important case when semiconductor heterolasers operate in the active mode-locking regime. This approach involves the joint Wigner time-frequency distributions, which can be created for those pulses due to exploitation of a novel interferometric technique under discussion. Practically, the InGaAsP/InP-heterolasers generating at the wavelength 1320 nm were used during the experiments carried out and an opportunity of reconstructing the corresponding joint Wigner time-frequency distributions was successfully demonstrated.
Versión del editorhttp://dx.doi.org/10.1117/12.838469
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