Combining high temperature sample preparation and in-situ magnetic fields in XPEEM

Abstract

We present a custom-made sample holder system for use in Elmitec Low Energy and PhotoEmission Electron Microscopes. It consists of two different sample holder bodies: one with a filament for high temperature measurements (up to more than 1500 K) and the other with integrated electromagnets for the in-situ application of in-plane/out-of-plane small magnetic fields. The sample is placed on a platelet which can be transferred between the two holders. This opens up new possibilities for the preparation of samples at high temperatures and investigation of their behavior under applied magnetic fields without leaving the ultra high vacuum system.