Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/228791
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Title

Combining high temperature sample preparation and in-situ magnetic fields in XPEEM

AuthorsMandziak, Anna; de la Figuera, Juan CSIC ORCID CVN; Prieto, José E.; Prat, Jordi; Foerster, Michael; Aballe, Lucía
KeywordsSample holder
LEEM
PEEM
Growth
Magnetic domains
Issue Date3-May-2020
PublisherElsevier BV
CitationUltramicroscopy 214: 1130102 (2020)
AbstractWe present a custom-made sample holder system for use in Elmitec Low Energy and PhotoEmission Electron Microscopes. It consists of two different sample holder bodies: one with a filament for high temperature measurements (up to more than 1500 K) and the other with integrated electromagnets for the in-situ application of in-plane/out-of-plane small magnetic fields. The sample is placed on a platelet which can be transferred between the two holders. This opens up new possibilities for the preparation of samples at high temperatures and investigation of their behavior under applied magnetic fields without leaving the ultra high vacuum system.
Description5 pags., 5 figs.
Publisher version (URL)http://dx.doi.org/10.1016/j.ultramic.2020.113010
URIhttp://hdl.handle.net/10261/228791
Identifiersdoi: 10.1016/j.ultramic.2020.113010
issn: 1879-2723
Appears in Collections:(IQFR) Artículos

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