Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/226039
COMPARTIR / EXPORTAR:
logo share SHARE logo core CORE BASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE

Invitar a revisión por pares abierta
Título

Structural determination of the Bi(110) semimetal surface by LEED analysis and ab initio calculations

AutorSun, J.; Mikkelsen, A.; Fuglsang Jensen, M.; Koroteev, Yuri M.; Bihlmayer, Gustav; Chulkov, Eugene V. CSIC ORCID; Adams, D. L.; Hofmann, Ph.; Pohl, K.
Fecha de publicación2006
EditorAmerican Physical Society
CitaciónPhysical Review B 74(24): 245406 (2006)
ResumenThe surface structure of Bi(110) has been investigated by low-energy electron diffraction intensity analysis and by first-principles calculations. Diffraction patterns at a sample temperature of 110K and normal incidence reveal a bulk truncated (1×1) surface without indication of any structural reconstruction despite the presence of dangling bonds on the surface layer. Good agreement is obtained between the calculated and measured diffraction intensities for this surface containing only one mirror-plane symmetry element and a buckled bilayer structure. No significant interlayer spacing relaxations are found. The Debye temperature for the surface layer is found to be lower than in the bulk, which is indicative of larger atomic vibrational amplitudes at the surface. Meanwhile, the second layer shows a Debye temperature close to the bulk value. The experimental results for the relaxations agree well with those of our first-principles calculation.
Versión del editorhttps://doi.org/10.1103/PhysRevB.74.245406
URIhttp://hdl.handle.net/10261/226039
DOI10.1103/PhysRevB.74.245406
ISSN2469-9950
Aparece en las colecciones: (CFM) Artículos




Ficheros en este ítem:
Fichero Descripción Tamaño Formato
strucalcu.pdf991,72 kBAdobe PDFVista previa
Visualizar/Abrir
Mostrar el registro completo

CORE Recommender

SCOPUSTM   
Citations

15
checked on 12-mar-2024

WEB OF SCIENCETM
Citations

14
checked on 23-feb-2024

Page view(s)

74
checked on 18-mar-2024

Download(s)

187
checked on 18-mar-2024

Google ScholarTM

Check

Altmetric

Altmetric


NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.