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Title

Visualizing the Effect of an Electrostatic Gate with Angle-Resolved Photoemission Spectroscopy

AuthorsJoucken, F.; Avila, J.; Ge, Z.; Quezada-Lopez, E.A.; Yi, H.; Le Goff, R.; Baudin, E.; Davenport, J.L.; Watanabe, K.; Taniguchi, T.; Asensio, María C. CSIC ORCID; Velasco, J.
KeywordsElectrostatic gating
ARPES
NanoARPES
Bilayer graphene
Van der Waals heterostructure
Electronic structure
Issue Date2019
PublisherAmerican Chemical Society
CitationNano Letters 19: 2682- 2687 (2019)
Abstract[EN] Electrostatic gating is pervasive in materials science, yet its effects on the electronic band structure of materials has never been revealed directly by angle-resolved photoemission spectroscopy (ARPES), the technique of choice to noninvasively probe the electronic band structure of a material. By means of a state-of-the-art ARPES setup with submicron spatial resolution, we have investigated a heterostructure composed of Bernal-stacked bilayer graphene (BLG) on hexagonal boron nitride and deposited on a graphite flake. By voltage biasing the latter, the electric field effect is directly visualized on the valence band as well as on the carbon 1s core level of BLG. The band gap opening of BLG submitted to a transverse electric field is discussed and the importance of intra layer screening is put forward. Our results pave the way for new studies that will use momentum-resolved electronic structure information to gain insight on the physics of materials submitted to the electric field effect.
Publisher version (URL)http://dx.doi.org/10.1021/acs.nanolett.9b00649
URIhttp://hdl.handle.net/10261/217952
DOI10.1021/acs.nanolett.9b00649
Identifiersdoi: 10.1021/acs.nanolett.9b00649
e-issn: 1530-6992
issn: 1530-6984
Appears in Collections:(ICMM) Artículos

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