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| Título: | Determination of texture by infrared spectroscopy in titanium oxide–anatase thin films |
Autor: | Pecharromán, Carlos CSIC ORCID CVN ; Gracía, Francisco; Holgado, Juan P. CSIC ORCID; Ocaña, Manuel CSIC ORCID; González-Elipe, Agustín R. CSIC ORCID; Bassas, J.; Santiso, José CSIC ORCID; Figueras, Albert CSIC ORCID | Palabras clave: | Titanium compounds Texture Infrared spectra X-ray diffraction Crystallites Dielectric thin films |
Fecha de publicación: | 15-abr-2003 | Editor: | American Institute of Physics | Citación: | Journal of Applied Physics 93(8): 4634 (2003) | Resumen: | A theoretical model to determine the effective dielectric tensor of heterogeneous materials composed by anisotropic microcrystallites has been introduced to explain the infrared spectral features of textured thin films of uniaxial materials as the function of a textural parameter. This theoretical treatment is able to satisfactorily reproduce the experimental absorbance spectra of TiO2–anatase thin films chosen as a model system. Comparison of texture data obtained from infrared spectroscopy and x-ray diffraction are in good agreement which support the validity of the proposed model. | Descripción: | 12 pages, 6 figures, 4 tables, 2 appendix.-- PACS: 68.55.Jk; 78.66.Nk; 78.30.Hv | Versión del editor: | http://dx.doi.org/10.1063/1.1560858 | URI: | http://hdl.handle.net/10261/21699 | DOI: | 10.1063/1.1560858 | ISSN: | 0021-8979 |
| Aparece en las colecciones: | (ICMAB) Artículos (ICMM) Artículos (ICMS) Artículos |
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