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Título

Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

AutorTejedor, Paloma; Díez-Merino, Laura ; Beinik, Igor; Teichert, Christian
Palabras claveAtomic force microscopy
Electrical conductivity
Electron mobility
Free energy
Gallium arsenide
III-V semiconductors
Fecha de publicación21-sep-2009
EditorAmerican Institute of Physics
CitaciónApplied Physics Letters 95(12): 123103 (2009)
ResumenConductive atomic force microscopy has been used to investigate the effect of atomic hydrogen and step orientation on the growth behavior of InAs on GaAs (110) misoriented substrates. Samples grown by conventional molecular beam epitaxy exhibit higher conductivity on [10]-multiatomic step edges, where preferential nucleation of InAs nanowires takes place by step decoration. On H-terminated substrates with triangular terraces bounded by [15]-type steps, three-dimensional InAs clusters grow selectively at the terrace apices as a result of a kinetically driven enhancement in upward mass transport via AsHx intermediate species and a reduction in the surface free energy.
Descripción3 pages, 2 figures.-- PACS: 81.05.Ea; 72.20.Fr; 65.80.+n; 68.35.Md; 73.63.Nm; 68.37.Ps; 61.46.Km; 81.15.Hi
Versión del editorhttp://dx.doi.org/10.1063/1.3232234
URIhttp://hdl.handle.net/10261/21658
DOI10.1063/1.3232234
ISSN0003-6951
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