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Título

Stress-induced depolarization of (Pb, La)TiO3 ferroelectric thin films by nanoindentation

AutorAlgueró, Miguel ; Bushby, A. J.; Reece, M. J.; Poyato, Rosalia; Ricote, J. ; Calzada, M. L. ; Pardo, Lorena
Palabras claveLead compounds
Lanthanum compounds
Ferroelectric thin films
Dielectric depolarisation
Fecha de publicación3-dic-2001
EditorAmerican Institute of Physics
CitaciónApplied Physics Letters 79(23): 3830 (2001)
ResumenElectrical depolarization has been observed in lanthanum-modified lead titanate ferroelectric thin films stressed by nanoindentation. A spherical metallic indenter was used as a top electrode to locally pole the films and then to measure the depolarization current intensity. The current intensity had distinctive maxima at given indentation forces. These are related to the stress thresholds for the depolarization mechanism, which is probably 90° domain wall movements. Knowledge of the depolarization stresses is necessary for the design of microelectromechanical systems that include a ferroelectric layer.
Descripción3 pages, 3 figures.-- PACS: 77.84.Dy; 77.55.+f; 77.22.Ej; 68.60.Bs; 85.85.+j; 77.80.Dj; 62.20.Mk
Versión del editorhttp://dx.doi.org/10.1063/1.1418258
URIhttp://hdl.handle.net/10261/21571
DOI10.1063/1.1418258
ISSN0003-6951
Aparece en las colecciones: (ICMM) Artículos
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