Please use this identifier to cite or link to this item:
logo share SHARE BASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE

Invite to open peer review

FEA study of shear mode decoupling in non-standard thin plates of a lead-free piezoelectric ceramic

AuthorsOchoa, Pilar CSIC; González, Amador M.; García, Álvaro CSIC; Jiménez-Martínez, Francisco Javier; Vázquez-Rodríguez, Manuel; Pardo, Lorena CSIC ORCID
Finite Element Analysis
Piezoelectric materials
Titanium Compounds
Issue Date20-May-2020
PublisherInstitute of Electrical and Electronics Engineers
CitationIEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control
Abstract[EN] The Finite Element Analysis (FEA) is used in this work to study the impedance curves and modes of motion at resonance of non-standard shear plates, thickness poled and longitudinally excited. An ecological, lead-free, piezoelectric ceramic of (1-x)(Bi0.5Na0.5)TiO3–xBaTiO3 with x=0.06 (BNBT6) composition is studied. The FEA modeling is based on the full matrix of the material coefficients. These are obtained from complex impedance measurements on two thickness poled resonators. A study as a function of the variations of the dimensions of the plate was accomplished (t=thickness for poling, and L, w=lateral dimensions, where w is the distance between electrodes for the electrical excitation). We aimed to a further understanding, and, thus, ability to control, the coupling of the main shear resonance and the lateral modes. The use of uncoupled shear modes to obtain the material parameters is a key issue for their determination as complex quantities, thus considering all material losses, electromechanical, dielectric and elastic.
Publisher version (URL)
Appears in Collections:(ICMM) Artículos

Files in This Item:
File Description SizeFormat
Ochoa_FEA_TUFFC2996083_2020_postprint.pdfPostprint2,9 MBAdobe PDFThumbnail
Show full item record

CORE Recommender

Page view(s)

checked on Apr 15, 2024


checked on Apr 15, 2024

Google ScholarTM


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.