Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/21512
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dc.contributor.authorCasas Cabanas, Montse-
dc.contributor.authorPalacín, M. Rosa-
dc.contributor.authorRodríguez-Carvajal, Juan-
dc.date.accessioned2010-02-23T14:16:15Z-
dc.date.available2010-02-23T14:16:15Z-
dc.date.issued2005-12-
dc.identifier.citationPowder Diffraction 20(4): 334-344 (2005)en_US
dc.identifier.issn0885-7156-
dc.identifier.urihttp://hdl.handle.net/10261/21512-
dc.description11 pages.-- PACS: 61.72.Nn; 61.10.Nz; 61.72.Ff; 68.37.Lpen_US
dc.description.abstractTwo different approaches for studying sample's contributions to diffraction-line broadening are analyzed by applying them to several nickel hydroxide samples. Both are based in the refinement of powder diffraction data but differ in the microstructural model used. The first one consists in the refinement of the powder diffraction pattern using the FAULTS program, a modification of DIFFaX, which assigns peak broadening mainly to the presence of stacking faults and treats finite size effects by convolution with a Voigt function. The second method makes use of the program FULLPROF, which allows the use of linear combinations of spherical harmonics to model peak broadening coming from anisotropic size effects. The complementary use of transmission electron microscopy has allowed us to evaluate the best approach for the Ni(OH)2 case. In addition, peak shifts, corresponding to reflections 10l (l0) were observed in defective nickel hydroxide samples that can be directly correlated with the degree of faulting.en_US
dc.format.extent259768 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoengen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rightsclosedAccessen_US
dc.subjectCrystal microstructureen_US
dc.subjectNickel compoundsen_US
dc.subjectStacking faultsen_US
dc.subjectX-ray diffractionen_US
dc.subjectSpectral Line breadthen_US
dc.subjectTransmission electron microscopyen_US
dc.titleMicrostructural analysis of nickel hydroxide: Anisotropic size versus stacking faultsen_US
dc.typeartículoen_US
dc.identifier.doi10.1154/1.2137340-
dc.description.peerreviewedPeer revieweden_US
dc.relation.publisherversionhttp://dx.doi.org/10.1154/1.2137340en_US
dc.type.coarhttp://purl.org/coar/resource_type/c_6501es_ES
item.openairetypeartículo-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
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