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Título

Nano-oxidation of silicon surfaces: Comparison of noncontact and contact atomic-force microscopy methods

AutorTello Ruiz, Marta ; García García, Ricardo
Fecha de publicación16-jul-2001
EditorAmerican Institute of Physics
CitaciónApplied Physics Letters 79(3): 424 82001)
ResumenLocal oxidation lithography by atomic-force microscopy is emerging as a powerful method for nanometer-scale patterning of surfaces. Here, we perform a comparative study of contact and noncontact atomic-force microscopy (AFM) oxidation experiments. The comparison of height and width dependencies on voltage and pulse duration allows establishing noncontact AFM as the optimum local oxidation method. For the same electrical conditions, noncontact AFM oxides exhibit higher aspect ratios (0.04 vs 0.02). The smallness of the liquid meniscus in noncontact AFM oxidation produces smaller oxide widths. We also report a slower oxidation rate in contact AFM oxidation. We explain this result by introducing an effective energy barrier (~0.14 eV) that includes the mechanical work done by the growing oxide against the cantilever (~0.01 eV).
Descripción3 pages, 4 figures.
Versión del editorhttp://dx.doi.org/10.1063/1.1385582
URIhttp://hdl.handle.net/10261/21374
DOI10.1063/1.1385582
ISSN0003-6951
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