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DEPFET pixel detector in the Belle II experiment

AuthorsAbudinen, F.; Boronat Arévalo, Marçà ; Esperante Pereira, Daniel ; Fuster, Juan ; Gomis, P.; Lacasta Llácer, Carlos ; Moya, David ; Sánchez, J. G.; Vila, Iván ; Virto, A. L.; Vos, Marcel
KeywordsSolid state detectors—poster session
Tracking detectors
Pixel detectors
Silicon detectors
Belle II
Issue Date2019
CitationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 936: 657-659 (2019)
AbstractThe Belle II experiment will run with a reduced beam asymmetry and a factor of 40 higher instantaneous luminosity compared to the Belle experiment. To cope with this and to be able to perform high precision vertex measurements for charge conjugation parity violating processes, a pixel detector based on DEPFET technology will be installed in the center of Belle II. Its basic properties and the DAQ chain are presented in this article.
DescriptionBelle II DEPFET and PXD Collaboration: et al.
Publisher version (URL)https://doi.org/10.1016/j.nima.2018.10.048
Identifiersdoi: 10.1016/j.nima.2018.10.048
issn: 0168-9002
Appears in Collections:(IFIC) Artículos
(IFCA) Artículos
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