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dc.contributor.authorSics, Igors-
dc.contributor.authorNogales Ruiz, Aurora-
dc.contributor.authorEzquerra, Tiberio A.-
dc.contributor.authorDenchev, Zlatan-
dc.contributor.authorBaltá Calleja, Francisco José-
dc.contributor.authorMeyer, A.-
dc.contributor.authorDöhrmann, R.-
dc.date.accessioned2010-02-15T13:32:02Z-
dc.date.available2010-02-15T13:32:02Z-
dc.date.issued2000-04-
dc.identifier.citationReview of Scientific Instruments 71(4): 1733 (2000)en_US
dc.identifier.issn0034-6748-
dc.identifier.urihttp://hdl.handle.net/10261/21098-
dc.description4 pages, 6 figures.en_US
dc.description.abstractA novel experimental setup is described which allows one to obtain detailed information on structural and dynamical changes in polymers during crystallization. This technique includes simultaneous measurements of small angle-wide angle x-ray scattering and dielectric spectroscopy (SWD). The capabilities of the technique have been probed by following in real time the crystallization process of a model crystallizable polymer: poly(ethylene terephthalate). By performing these experiments, simultaneous information from both, the amorphous and the crystalline phase is obtained providing a complete description of changes occurring during a crystallization process. The SWD technique opens up new promising perspectives for the experimental study of the relation between structure and dynamics in materials science.en_US
dc.description.sponsorshipThe authors are indebted to the DGICYT (Grant No. PB 94-0049) and to Comunidad de Madrid (07N/0063/1998), Spain, for generous support of this investigation. I. S. thanks a AECI (Spain) for the tenure of a fellowship. A. N. thanks the support from the FPI program of the Spanish Ministry of Science and Culture (MEC). Z.D. thanks MEC for the tenure of a fellowship of the program ‘‘Científicos y Tecnólogos Extranjeros.’’ The experiments at HASYLAB (Hamburg, Germany) have been funded by the program Human Capital and Mobility, Access to large Installations EC (ERBFMGEDT 950059).en_US
dc.format.extent97931 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoengen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rightsopenAccessen_US
dc.titleSimultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymersen_US
dc.typeArtículoen_US
dc.identifier.doi10.1063/1.1150528-
dc.description.peerreviewedPeer revieweden_US
dc.relation.publisherversionhttp://dx.doi.org/10.1063/1.1150528en_US
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