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Título

Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers

AutorSics, Igors; Nogales Ruiz, Aurora; Ezquerra, Tiberio A. ; Denchev, Zlatan; Baltá Calleja, Francisco José ; Meyer, A.; Döhrmann, R.
Fecha de publicaciónabr-2000
EditorAmerican Institute of Physics
CitaciónReview of Scientific Instruments 71(4): 1733 (2000)
ResumenA novel experimental setup is described which allows one to obtain detailed information on structural and dynamical changes in polymers during crystallization. This technique includes simultaneous measurements of small angle-wide angle x-ray scattering and dielectric spectroscopy (SWD). The capabilities of the technique have been probed by following in real time the crystallization process of a model crystallizable polymer: poly(ethylene terephthalate). By performing these experiments, simultaneous information from both, the amorphous and the crystalline phase is obtained providing a complete description of changes occurring during a crystallization process. The SWD technique opens up new promising perspectives for the experimental study of the relation between structure and dynamics in materials science.
Descripción4 pages, 6 figures.
Versión del editorhttp://dx.doi.org/10.1063/1.1150528
URIhttp://hdl.handle.net/10261/21098
DOI10.1063/1.1150528
ISSN0034-6748
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