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Título

X-ray diffraction and extended x-ray absorption fine-structure characterization of nonspherical crystallographic grains in iron thin films

AutorJiménez-Villacorta, Félix ; Muñoz-Martín, A. ; Prieto, C.
Fecha de publicación1-dic-2004
EditorAmerican Institute of Physics
CitaciónJournal of Applied Physics 96(11): 6224 (2004)
ResumenThe characterization of iron thin films grown at different substrate temperatures has been performed by x-ray diffraction (XRD) and extended x-ray absorption fine structure (EXAFS). The film growing of iron at low temperatures provides an excellent system to test the results obtained from both techniques because the crystallographic grains present a variation of size and shape as a function of the growing temperature. In both cases, the shape of the particle must be taken into account to calculate their size. The comparison gives a very good agreement when appropriate models are used, showing the reasons for possible differences between the results obtained from a more simple XRD and EXAFS analysis applied to columnar growth systems.
Descripción6 pages, 8 figures, 2 tables.
Versión del editorhttp://dx.doi.org/10.1063/1.1810636
URIhttp://hdl.handle.net/10261/21080
DOI10.1063/1.1810636
ISSN0021-8979
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