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X-ray diffraction and extended x-ray absorption fine-structure characterization of nonspherical crystallographic grains in iron thin films

AuthorsJiménez-Villacorta, Félix ; Muñoz-Martín, A. ; Prieto, C.
Issue Date1-Dec-2004
PublisherAmerican Institute of Physics
CitationJournal of Applied Physics 96(11): 6224 (2004)
AbstractThe characterization of iron thin films grown at different substrate temperatures has been performed by x-ray diffraction (XRD) and extended x-ray absorption fine structure (EXAFS). The film growing of iron at low temperatures provides an excellent system to test the results obtained from both techniques because the crystallographic grains present a variation of size and shape as a function of the growing temperature. In both cases, the shape of the particle must be taken into account to calculate their size. The comparison gives a very good agreement when appropriate models are used, showing the reasons for possible differences between the results obtained from a more simple XRD and EXAFS analysis applied to columnar growth systems.
Description6 pages, 8 figures, 2 tables.
Publisher version (URL)http://dx.doi.org/10.1063/1.1810636
Appears in Collections:(ICMM) Artículos
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