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Infrared spectroscopic ellipsometry and optical spectroscopy of plasmons in classic 3D topological insulators

AuthorsMamedov, Nazim T.; Alizade, Elvin H.; Jahangirli, Zakir A.; Aliev, Ziya S.; Abdullayev, Nadir A.; Mammadov, Samir N.; Amiraslanov, I. R.; Shim, Yong-Gu; Wakita, Kazuki; Ragimov, Sadiyar S.; Bayramov, Ayaz I.; Babanly, M. B.; Shikin, Alexander M.; Chulkov, Eugene V. CSIC ORCID
Issue DateNov-2019
PublisherAIP Publishing
CitationJournal of Vacuum Science and Technology B:Nanotechnology and Microelectronics 37(6): 062602 (2019)
AbstractNarrow bandgap BiSe, BiTe, and SbTe, commonly referred to as classic 3D topological insulators, were studied at room temperature by spectroscopic ellipsometry and optical reflection spectroscopy over the mid-IR-near-infrared photon energy range. Complementarily, Hall measurements were performed. Plasmons in optical loss function and reflection coefficient were identified. The conventional approach based on the high frequency dielectric constant was shown to work well in the description of plasmons in BiSe and SbTe and to fail in the case of a similar compound, BiTe. The obtained results are discussed in terms of single- and multivalley approaches to the studied samples with taking the details of the calculated band structure into account.
Publisher version (URL)http://dx.doi.org/10.1116/1.5122776
Identifiersdoi: 10.1116/1.5122776
e-issn: 2166-2754
issn: 2166-2746
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