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dc.contributor.authorFlores, Eduardo-
dc.contributor.authorYoda, Satoko-
dc.contributor.authorMorales, Carlos-
dc.contributor.authorCaballero-Calero, Olga-
dc.contributor.authorDíaz-Chao, Pablo-
dc.contributor.authorMartín-González, Marisol-
dc.contributor.authorAres, José R.-
dc.contributor.authorFerrer, Isabel J.-
dc.contributor.authorSánchez, Carlos-
dc.date.accessioned2020-03-06T11:49:53Z-
dc.date.available2020-03-06T11:49:53Z-
dc.date.issued2019-02-28-
dc.identifierdoi: 10.1016/j.tsf.2019.01.020-
dc.identifierissn: 0040-6090-
dc.identifier.citationThin Solid Films 672: 138-145 (2019)-
dc.identifier.urihttp://hdl.handle.net/10261/203047-
dc.description.abstractRecent published literature dealing with FeS pyrite (thin films and single crystals) faces a few and relevant issues: the low photovoltage presented by pyrite (mainly related to the singular nature of its surface), the not yet clearly defined way of making available n and p type reliable samples and the relevance of their stoichiometry. To address the second and third issues, Fe thin films, Ti/Fe and Co/Fe bilayers deposited on sodalime glass and amorphous quartz substrates have been sulfurated at different temperatures (T) (T ≲ 600C) during 20 h to obtain pyrite thin films. Seebeck coefficient and Hall Effect measurements have been carried out at room temperature with the sulfurated samples. It has been found that sulfurated Ti/Fe on sodalime glass presents a change of the Seebeck coefficient sign (from negative to positive) due to a strong interaction of the Ti layer with the substrate, which is not present in the Ti/Fe samples deposited on amorphous quartz. As a consequence of the interaction, a new TiO layer is formed between the sodalime glass substrate and the pyrite layer. Sulfurated Co/Fe bilayers on sodalime glass show a coherent behavior according to the obtained results and previously published works. They all appear to be n-type semiconductors when T ≳ 175C. Non-intentionally doped Fe thin films on sodalime glass behave in a non-conclusive fashion from the point of view of their electrical transport characterization. The Seebeck coefficient (S) of the sulfurated films appear to be S > 0 for all values of T. However, the value and sign of the Hall constant behave in a non-reproducible way. Results are discussed on the light of present knowledge of synthetic pyrite thin films growth and doping.-
dc.description.sponsorshipThe authors thank technical support from Mr. F. Moreno. Financial support by MINECO-FEDER (MAT2015-65203R) is acknowledged and the project INFANTE (PIE 201550E072) is also recognized. Carlos Morales thanks the Ministerio de Educación Cultura y Deporte of Spain for the FPU grant.-
dc.languageeng-
dc.publisherElsevier BV-
dc.relationMINECO/ICTI2013-2016/MAT2015-65203-R-
dc.rightsclosedAccess-
dc.titlePyrite thin films on amorphous substrates: Interaction with the substrate and doping effects-
dc.typeartículo-
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.tsf.2019.01.020-
dc.date.updated2020-03-06T11:49:53Z-
dc.contributor.funderMinisterio de Economía y Competitividad (España)-
dc.contributor.funderMinisterio de Educación, Cultura y Deporte (España)-
dc.contributor.funderEuropean Commission-
dc.relation.csic-
dc.identifier.funderhttp://dx.doi.org/10.13039/501100003329es_ES
dc.identifier.funderhttp://dx.doi.org/10.13039/501100003176es_ES
dc.identifier.funderhttp://dx.doi.org/10.13039/501100000780es_ES
dc.contributor.orcidFlores, Eduardo [0000-0003-4769-0873]-
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