Por favor, use este identificador para citar o enlazar a este item:
http://hdl.handle.net/10261/202097
COMPARTIR / EXPORTAR:
SHARE CORE BASE | |
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE | |
Título: | Engineering vacancies in Bi2S3 yielding sub-bandgap photoresponse and highly sensitive short-wave infrared photodetectors |
Autor: | Huo, Nengjie; Figueroba, Alberto; Yang, Yujue; Christodoulou, Sotirios; Stavrinadis, Alexandros; Magén, César ; Konstantatos, Gerasimos | Fecha de publicación: | 2019 | Editor: | Wiley-VCH | Citación: | Advanced Optical Materials 7: 1900258 (2019) | Resumen: | Defects play an important role in tailoring the optoelectronic properties of materials. Here we demonstrate that sulphur vacancies are able to engineer sub-band photoresponse into the short-wave infrared range due to formation of in-gap states in Bi2S3 single crystals supported by density functional (DF) calculations. Sulfurization and subsequent refill of the vacancies results in faster response but limits the spectral range to the near infrared as determined by the bandgap of Bi2S3. A facile chemical treatment is then explored to accelerate the speed of sulphur deficient (SD)-based detectors on the order of 10 ms without sacrificing its spectral coverage into the infrared, while holding a high D* close to 10^15 Jones in the visible-near infrared range and 10^12 Jones at 1.6 um. This work also provides new insights into the role sulphur vacancies play on the electronic structure and, as a result, into sub-bandgap photoresponse enabling ultrasensitive, fast and broadband photodetectors. | Versión del editor: | https://doi.org/10.1002/adom.201900258 | URI: | http://hdl.handle.net/10261/202097 | DOI: | 10.1002/adom.201900258 | E-ISSN: | 2195-1071 |
Aparece en las colecciones: | (ICMA) Artículos |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
---|---|---|---|---|
enginphoto.pdf | 1,57 MB | Adobe PDF | Visualizar/Abrir |
CORE Recommender
SCOPUSTM
Citations
37
checked on 20-abr-2024
WEB OF SCIENCETM
Citations
35
checked on 27-feb-2024
Page view(s)
150
checked on 23-abr-2024
Download(s)
317
checked on 23-abr-2024
Google ScholarTM
Check
Altmetric
Altmetric
NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.