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dc.contributor.authorSaraza-Canflanca, P.es_ES
dc.contributor.authorDíaz-Fortuny, J.es_ES
dc.contributor.authorCastro-López, R.es_ES
dc.contributor.authorRoca, Elisendaes_ES
dc.contributor.authorMartín-Martínez, J.es_ES
dc.contributor.authorRodríguez, R.es_ES
dc.contributor.authorNafria, M.es_ES
dc.contributor.authorFernández, Francisco V.es_ES
dc.date.accessioned2020-02-24T09:03:33Z-
dc.date.available2020-02-24T09:03:33Z-
dc.date.issued2020-
dc.identifier.citationIntegration - The VLSI Journal, 72 : 13-20 (2020)es_ES
dc.identifier.urihttp://hdl.handle.net/10261/201630-
dc.description.abstractIn the past few years, Time-Dependent Variability has become a subject of growing concern in CMOS technologies. In particular, phenomena such as Bias Temperature Instability, Hot-Carrier Injection and Random Telegraph Noise can largely affect circuit reliability. It becomes therefore imperative to develop reliability-aware design tools to mitigate their impact on circuits. To this end, these phenomena must be first accurately characterized and modeled. And, since all these phenomena reveal a stochastic nature for deeply-scaled integration technologies, they must be characterized massively on devices to extract the probability distribution functions associated to their characteristic parameters. In this work, a complete methodology to characterize these phenomena experimentally, and then extract the necessary parameters to construct a Time-Dependent Variability model, is presented. This model can be used by a reliability simulator.es_ES
dc.language.isoenges_ES
dc.publisherElsevieres_ES
dc.relation.isversionofPostprintes_ES
dc.rightsembargoedAccesses_ES
dc.titleA Robust and Automated Methodology for the Analysis of Time-Dependent Variability at Transistor Leveles_ES
dc.typeartículoes_ES
dc.identifier.doi10.1016/j.vlsi.2020.02.002-
dc.description.peerreviewedPeer reviewedes_ES
dc.relation.publisherversionhttps://doi.org/10.1016/j.vlsi.2020.02.002es_ES
dc.embargo.terms2022-02-10es_ES
dc.relation.csices_ES
oprm.item.hasRevisionno ko 0 false*
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