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http://hdl.handle.net/10261/201104
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Campo DC | Valor | Lengua/Idioma |
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dc.contributor.author | Díaz-Fortuny, Javier | es_ES |
dc.contributor.author | Saraza-Canflanca, P. | es_ES |
dc.contributor.author | Castro-López, R. | es_ES |
dc.contributor.author | Roca, Elisenda | es_ES |
dc.contributor.author | Martín-Martínez, Javier | es_ES |
dc.contributor.author | Rodríguez, Rosana | es_ES |
dc.contributor.author | Fernández, Francisco V. | es_ES |
dc.contributor.author | Nafría, Montserrat | es_ES |
dc.date.accessioned | 2020-02-18T11:31:09Z | - |
dc.date.available | 2020-02-18T11:31:09Z | - |
dc.date.issued | 2020 | - |
dc.identifier.citation | IEEE Transactions on Instrumentation and Measurement, 69(3): 853-864 (2020) | es_ES |
dc.identifier.uri | http://hdl.handle.net/10261/201104 | - |
dc.description.abstract | This paper presents an innovative and automated measurement setup for the characterization of variability effects in CMOS transistors using array-based integrated circuits, through which a better understanding of CMOS reliability could be attained. This setup addresses the issues that come with the need for a trustworthy statistical characterization of these effects: testing a very large number of devices accurately but, also, in a timely manner. The setup consists of software and hardware components that provide a user-friendly interface to perform the statistical characterization of CMOS transistors. Five different electrical tests, comprehending time-zero and time-dependent variability effects, can be carried out. Test preparation is, with the described setup, reduced to a few seconds. Moreover, smart parallelization techniques allow reducing the typically timeconsuming aging characterization from months to days or even hours. The scope of this paper thus encompasses the methodology and practice of measurement of CMOS time-dependent variability, as well as the development of appropriate measurement systems and components used in efficiently generating and acquiring the necessary electrical signals | es_ES |
dc.language.iso | eng | es_ES |
dc.publisher | Institute of Electrical and Electronics Engineers | es_ES |
dc.relation.isversionof | Postprint | es_ES |
dc.rights | openAccess | en_EN |
dc.subject | Variability | es_ES |
dc.subject | Aging | es_ES |
dc.subject | BTI | es_ES |
dc.subject | HCI | es_ES |
dc.subject | RTN | es_ES |
dc.subject | Device Modelling | es_ES |
dc.subject | Automated characterization lab | es_ES |
dc.title | Flexible Setup for the Measurement of CMOS Timedependent Variability with Array-based Integrated Circuits | es_ES |
dc.type | artículo | es_ES |
dc.identifier.doi | 10.1109/TIM.2019.2906415 | - |
dc.description.peerreviewed | Peer reviewed | es_ES |
dc.relation.publisherversion | https://doi.org/10.1109/TIM.2019.2906415 | es_ES |
dc.embargo.terms | 2020-04-19 | es_ES |
dc.relation.csic | Sí | es_ES |
oprm.item.hasRevision | no ko 0 false | * |
dc.type.coar | http://purl.org/coar/resource_type/c_6501 | es_ES |
item.openairetype | artículo | - |
item.cerifentitytype | Publications | - |
item.languageiso639-1 | en | - |
item.grantfulltext | open | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.fulltext | With Fulltext | - |
Aparece en las colecciones: | (IMSE-CNM) Artículos |
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TIM2019.pdf | 3,93 MB | Adobe PDF | Visualizar/Abrir |
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