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dc.contributor.authorDíaz-Fortuny, Javieres_ES
dc.contributor.authorSaraza-Canflanca, P.es_ES
dc.contributor.authorCastro-López, R.es_ES
dc.contributor.authorRoca, Elisendaes_ES
dc.contributor.authorMartín-Martínez, Javieres_ES
dc.contributor.authorRodríguez, Rosanaes_ES
dc.contributor.authorFernández, Francisco V.es_ES
dc.contributor.authorNafría, Montserrates_ES
dc.date.accessioned2020-02-18T11:31:09Z-
dc.date.available2020-02-18T11:31:09Z-
dc.date.issued2020-
dc.identifier.citationIEEE Transactions on Instrumentation and Measurement, 69(3): 853-864 (2020)es_ES
dc.identifier.urihttp://hdl.handle.net/10261/201104-
dc.description.abstractThis paper presents an innovative and automated measurement setup for the characterization of variability effects in CMOS transistors using array-based integrated circuits, through which a better understanding of CMOS reliability could be attained. This setup addresses the issues that come with the need for a trustworthy statistical characterization of these effects: testing a very large number of devices accurately but, also, in a timely manner. The setup consists of software and hardware components that provide a user-friendly interface to perform the statistical characterization of CMOS transistors. Five different electrical tests, comprehending time-zero and time-dependent variability effects, can be carried out. Test preparation is, with the described setup, reduced to a few seconds. Moreover, smart parallelization techniques allow reducing the typically timeconsuming aging characterization from months to days or even hours. The scope of this paper thus encompasses the methodology and practice of measurement of CMOS time-dependent variability, as well as the development of appropriate measurement systems and components used in efficiently generating and acquiring the necessary electrical signalses_ES
dc.language.isoenges_ES
dc.publisherInstitute of Electrical and Electronics Engineerses_ES
dc.relation.isversionofPostprintes_ES
dc.rightsopenAccessen_EN
dc.subjectVariabilityes_ES
dc.subjectAginges_ES
dc.subjectBTIes_ES
dc.subjectHCIes_ES
dc.subjectRTNes_ES
dc.subjectDevice Modellinges_ES
dc.subjectAutomated characterization labes_ES
dc.titleFlexible Setup for the Measurement of CMOS Timedependent Variability with Array-based Integrated Circuitses_ES
dc.typeartículoes_ES
dc.identifier.doi10.1109/TIM.2019.2906415-
dc.description.peerreviewedPeer reviewedes_ES
dc.relation.publisherversionhttps://doi.org/10.1109/TIM.2019.2906415es_ES
dc.embargo.terms2020-04-19es_ES
dc.relation.csices_ES
oprm.item.hasRevisionno ko 0 false*
dc.type.coarhttp://purl.org/coar/resource_type/c_6501es_ES
item.openairetypeartículo-
item.cerifentitytypePublications-
item.languageiso639-1en-
item.grantfulltextopen-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextWith Fulltext-
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