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Flexible Setup for the Measurement of CMOS Timedependent Variability with Array-based Integrated Circuits

AuthorsDíaz-Fortuny, Javier; Saraza-Caflanca, Pablo; Castro-López, Rafael; Roca, Elisenda ; Martín-Martínez, Javier; Rodríguez, Rosana; Fernández, Francisco V. ; Nafria, Montserrat
Device Modelling
Automated characterization lab
Issue Date2020
PublisherInstitute of Electrical and Electronics Engineers
CitationIEEE Transactions on Instrumentation and Measurement, 69(3): 853-864 (2020)
AbstractThis paper presents an innovative and automated measurement setup for the characterization of variability effects in CMOS transistors using array-based integrated circuits, through which a better understanding of CMOS reliability could be attained. This setup addresses the issues that come with the need for a trustworthy statistical characterization of these effects: testing a very large number of devices accurately but, also, in a timely manner. The setup consists of software and hardware components that provide a user-friendly interface to perform the statistical characterization of CMOS transistors. Five different electrical tests, comprehending time-zero and time-dependent variability effects, can be carried out. Test preparation is, with the described setup, reduced to a few seconds. Moreover, smart parallelization techniques allow reducing the typically timeconsuming aging characterization from months to days or even hours. The scope of this paper thus encompasses the methodology and practice of measurement of CMOS time-dependent variability, as well as the development of appropriate measurement systems and components used in efficiently generating and acquiring the necessary electrical signals
Publisher version (URL)https://doi.org/10.1109/TIM.2019.2906415
Appears in Collections:(IMSE-CNM) Artículos
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