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dc.contributor.author | Ibáñez Insa, Jordi | - |
dc.contributor.author | Hernández, S. | - |
dc.contributor.author | Alarcón-Lladó, Esther | - |
dc.contributor.author | Cuscó, Ramón | - |
dc.contributor.author | Artús, Lluís | - |
dc.contributor.author | Novikov, S. V. | - |
dc.contributor.author | Foxon, C. T. | - |
dc.date.accessioned | 2010-01-15T12:22:57Z | - |
dc.date.available | 2010-01-15T12:22:57Z | - |
dc.date.issued | 2008-07 | - |
dc.identifier.citation | Journal of Applied Physics 104(3): 33544(2008) | en_US |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/10261/20098 | - |
dc.description.abstract | We present a far-infrared transmission study on group-III nitride thin films. Cubic GaN and AlN layers and c-oriented wurtzite GaN, AlN, and AlxGa1−xN x 0.3 layers were grown by molecular beam epitaxy on GaAs and Si 111 substrates, respectively. The Berreman effect allows us to observe simultaneously the transverse optic and the longitudinal optic phonons of both the cubic and the hexagonal films as transmission minima in the infrared spectra acquired with obliquely incident radiation. We discuss our results in terms of the relevant electromagnetic theory of infrared transmission in cubic and wurtzite thin films. We compare the infrared results with visible Raman-scattering measurements. In the case of films with low scattering volumes and/or low Raman efficiencies and also when the Raman signal of the substrate material obscures the weaker peaks from the nitride films, we find that the Berreman technique is particularly useful to complement Raman spectroscopy. © 2008 American Institute of Physics. | en_US |
dc.description.sponsorship | This work was supported by the Spanish Ministry of Science and Technology Contract No. MAT2007-63617 and the Ramon y Cajal Programme and by the British EPSRCGB | en_US |
dc.format.extent | 294867 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | en_US |
dc.publisher | American Institute of Physics | en_US |
dc.rights | openAccess | en_US |
dc.title | Far-infrared transmission in GaN, AlN, and AlGaN thin films grown by molecular beam epitaxy | en_US |
dc.type | artículo | en_US |
dc.identifier.doi | 10.1063/1.2968242 | - |
dc.description.peerreviewed | Peer reviewed | en_US |
dc.relation.publisherversion | http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JAPIAU000104000003033544000001&idtype=cvips&gifs=yes | en_US |
dc.type.coar | http://purl.org/coar/resource_type/c_6501 | es_ES |
item.openairetype | artículo | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.grantfulltext | open | - |
item.fulltext | With Fulltext | - |
item.languageiso639-1 | en | - |
item.cerifentitytype | Publications | - |
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JApplPhys_104_033544.pdf | 287,96 kB | Adobe PDF | Visualizar/Abrir |
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