Please use this identifier to cite or link to this item:
http://hdl.handle.net/10261/19717
Share/Export:
![]() ![]() |
|
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE | |
Title: | In situ and ex situ grazing incidence diffraction anomalous fine structure study of GaN/AlN quantum dots |
Authors: | Coraux, Johann; Renevier, H.; Proietti, M. G. ; Favre-Nicolin, V.; Daudin, B.; Renaud, G. | Issue Date: | Jun-2006 | Publisher: | Wiley-Blackwell | Citation: | Physica Status Solidi - B - Basic Solid State Physics 243(7): 1519-1523 (2006) | Abstract: | We report on a general method that takes advantage of the full capability of anomalous diffraction and can be applied to the challenging case of small size embedded nanostructures. We study in situ and ex situ GaN Quantum Dots (QDs) grown by Plasma Assisted Molecular Beam Epitaxy (PAMBE), and encapsulated by an AlN epilayer. We investigate the QD strain and composition that are related to size, morphology, and cap layer thickness by means of anomalous diffraction in grazing incidence. The X-ray energy is tuned across the Ga K-edge where the Ga atoms scattering power is strongly modified and diffraction becomes chemically selective, giving direct information on composition. Quantitative analysis of the oscillatory extended region above the edge gives information on composition and out-of-plane strain of the dots. | Description: | 5 pages, 2 figures, 1 table.-- PACS 61.10.Eq, 61.10.Ht, 61.10.Nz, 61.46.+ w, 68.65.Cd, 68.65.Hb | Publisher version (URL): | http://dx.doi.org/10.1002/pssb.200565247 | URI: | http://hdl.handle.net/10261/19717 | DOI: | 10.1002/pssb.200565247 | ISSN: | 0370-1972 |
Appears in Collections: | (ICMA) Artículos |
Show full item record
Review this work
SCOPUSTM
Citations
3
checked on Jun 29, 2022
WEB OF SCIENCETM
Citations
2
checked on Jul 1, 2022
Page view(s)
301
checked on Jul 5, 2022
Google ScholarTM
Check
Altmetric
Dimensions
WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.