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Title

Preparation and characterization of 33S samples for 33S(n,)30Si cross-section measurements at the n_TOF facility at CERN

AuthorsPraena, Javier ; Ferrer, F. J. ; Vollenberg, W.; Sabaté-Gilarte, Marta; Fernández-Martínez, B. ; García López, J. ; Porras, Ignacio; Quesada, José Manuel; Altstadt, S.; Andrzejewski, J.; Audouin, L.; Mastromarco, M.; Mendoza, E.; Mengoni, A.; Milazzo, P. M.; Mingrone, F.; Mirea, M.; Mondelaers, W.; Paradela, C.; Pavlik, A.; Perkowski, J.; Sedyshev, P.; Plompen, A. J. M.; Rauscher, T.; Reifarth, R.; Riego-Perez, A.; Robles, M.; Rubbia, C.; Ryan, J. A.; Sarmento, R.; Saxena, A.; Schillebeeckx, P.; Tagliente, G.; Schmidt, S.; Schumann, D.; Tain, J. L.; Tarifeño-Saldivia, A.; Tarrío, D.; Tassan-Got, L.; Tsinganis, A.; Valenta, S.; Vannini, G.; Variale, V.; Bécares, V.; Vaz, P.; Ventura, A.; Vermeulen, M.J.; Vlachoudis, V.; Vlastou, R.; Wallner, A.; Ware, T.; Weigand, M.; Weiss, C.; Wright, T.; Barbagallo, M.; Žugec, P.; n_TOF Collaboration; Bečvář, F.; Belloni, F.; Berthoumieux, E.; Billowes, J.; Boccone, V.; Bosnar, D.; Brugger, Markus; Calviño, F.; Calviani, M.; Cano-Ott, D.; Carrapiço, C.; Cerutti, Francesco; Chiaveri, E.; Chin, N.; Colonna, N.; Cortés, G.; Córtes-Giraldo, M. A.; Diakaki, M.; Dietz, M.; Domingo Pardo, César ; Dressler, R.; Durán, I.; Eleftheriadis, C.; Ferrari, A.; Fraval, K.; Furman, V.; Göbel, K.; Gómez-Hornillos, B.; Ganesan, S.; García, A.R.; Giubrone, G.; Gonçalves, I. F.; González-Romero, E.; Goverdovski, A.; Griesmayer, E.; Guerrero, C.; Hernández-Prieto, A.; Heyse, J.; Jenkins, D. G.; Jericha, E.; Käppeler, F.; Kadi, Y.; Karadimos, D.; Katabuchi, T.; Ketlerov, V.; Khryachkov, V.; Kivel, N.; Koehler, P.; Kokkoris, M.; Kroll, J.; Krtička, M.; Lampoudis, C.; Langer, C.; Leal-Cidoncha, E.; Lederer, C.; Leeb, H.; Leong, L. S.; Lerendegui-Marco, J.; Losito, R.; Mallick, A.; Manousos, A.; Marganiec, J.; Martínez, T.; Massimi, C.; Mastinu, P.
KeywordsNeutron induced alpha emission
Thermal evaporation
Rutherford backscattering
Issue Date11-May-2018
PublisherElsevier
CitationNuclear Instruments and Methods in Physics Research - Section B 890: 142-147 (2018)
AbstractThin 33S samples for the study of the 33S(n,)30Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of 33S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of 33S has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.
Publisher version (URL)http://dx.doi.org/10.1016/j.nima.2018.02.055
URIhttp://hdl.handle.net/10261/195170
DOIhttp://dx.doi.org/10.1016/j.nima.2018.02.055
ISSN0168-9002
Appears in Collections:(CNA) Artículos
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