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Título

Identifying the nature of surface chemical modification for directed self-assembly of block copolymers

AutorEvangelio, Laura CSIC; Gramazio, Federico CSIC; Lorenzoni, Matteo; Gorgoi, Michaela; Espinosa, Francisco M. CSIC ORCID; García García, Ricardo CSIC ORCID; Perez Murano, Francesc X. CSIC ORCID ; Fraxedas, J. CSIC ORCID
Palabras claveDirected self-assembly
X-ray photoemission spectroscopy
Thin film
Chemical guiding patterns
Block copolymers
Fecha de publicación21-sep-2017
EditorBeilstein Institut
CitaciónBeilstein Journal of Nanotechnology 8: 1972-1981 (2017)
ResumenIn recent years, block copolymer lithography has emerged as a viable alternative technology for advanced lithography. In chemicalepitaxy- directed self-assembly, the interfacial energy between the substrate and each block copolymer domain plays a key role on the final ordering. Here, we focus on the experimental characterization of the chemical interactions that occur at the interface built between different chemical guiding patterns and the domains of the block copolymers. We have chosen hard X-ray high kinetic energy photoelectron spectroscopy as an exploration technique because it provides information on the electronic structure of buried interfaces. The outcome of the characterization sheds light onto key aspects of directed self-assembly: grafted brush layer, chemical pattern creation and brush/block co-polymer interface.
Versión del editorhttp://doi.org/10.3762/bjnano.8.198
URIhttp://hdl.handle.net/10261/188200
DOI10.3762/bjnano.8.198
Identificadoresdoi: 10.3762/bjnano.8.198
issn: 2190-4286
e-issn: 2190-4286
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