Dynamic secondary electron emission in dielectric/conductor mixed

Abstract

Secondary Emission Yield (SEY) of dielectric materials have a huge importance for prediction and test of the Multipaction discharge in RF components for space. An atypical behavior of the SEY on coatings composed by a mixture of conductor and dielectric microparticles was reported and modeled in [1]. In the proposed model, the interaction between dielectric and conductor particles was not taken into account but an effective action of the surface voltage generated in the sample. The aim of the present contribution is to modelize the effect the electric fields between dielectric and conductor particles have in the secondary electrons emitted by the sample. One of the most prominent features of the coatings is their roughness, so we propose a model that takes into account both the roughness and the charging of the dielectric particles to explain the unusual behavior of these coatings.