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Title

Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy

AuthorsGarcía García, Ricardo CSIC ORCID; Gómez Castro, Carlos Javier CSIC; Martínez Cuadrado, Nicolás Francisco CSIC; Patil, Shivprasad; Dietz, Christian CSIC ORCID; Magerle, R.
KeywordsAtomic force microscopy
AM-AFM
Energy-dissipation
Issue Date7-Jul-2006
PublisherAmerican Physical Society
CitationPhysical Review Letters 97, 016103 (2006)
AbstractIdentification of energy-dissipation processes at the nanoscale is demonstrated by using amplitude-modulation atomic force microscopy. The variation of the energy dissipated on a surface by a vibrating tip as a function of its oscillation amplitude has a shape that singles out the dissipative process occurring at the surface. The method is illustrated by calculating the energy-dissipation curves for surface energy hysteresis, long-range interfacial interactions and viscoelasticity. The method remains valid with independency of the amount of dissipated energy per cycle, from 0.1 to 50 eV. The agreement obtained between theory and experiments performed on silicon and polystyrene validates the method.
Publisher version (URL)http://link.aps.org/doi/10.1103/PhysRevLett.97.016103
httlp://dx.doi.org/10.1103/PhysRevLett.97.016103
URIhttp://hdl.handle.net/10261/18705
DOI10.1103/PhysRevLett.97.016103
ISSN0031-9007
Appears in Collections:(IMN-CNM) Artículos

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