English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/186083
Share/Impact:
Statistics
logo share SHARE   Add this article to your Mendeley library MendeleyBASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:

Title

Aberration corrected scanning transmission electron microscopy applied to ordered porous solids

AuthorsMayoral, Álvaro; Díaz Carretero, Isabel ; Carey, Thomas; Anderson, Paul A.
Issue Date11-Aug-2013
CitationXXII International Materials Research Congress (2013)
AbstractThe main drawback for electron microscopy analysis of zeolites and similar structures has been the low stability under the electron beam making the structural analysis of the materials or the acquisition of information of the cage content extraordinary difficult or even impossible in many cases. For the current work, different zeolites has been obtained via hydrothermal methods followed by, when necessary, the reaction between the porous solids and the metal precursors which were desired to be occluded in the pores. Subsequently, the samples were characterized by diverse techniques paying special attention to powder X-ray diffraction for a preliminary confirmation of the crystal structure and by spherical aberration, Cs, corrected STEM. Atomic resolution data of silver [1,2] and cadmium clusters as well the T atoms composing the zeolitic framework will be presented via Cs corrected STEM proving the feasibility of this technique to study the structural defects [3] of the materials and analyse the metal cluster conformation inside the zeolitic cavities.
DescriptionTrabajo presentado en el XXII International Materials Research Congress, celebrado en Cancún (México) del 11 al 15 de agosto de 2013.
URIhttp://hdl.handle.net/10261/186083
Appears in Collections:(ICP) Comunicaciones congresos
Files in This Item:
File Description SizeFormat 
accesoRestringido.pdf15,38 kBAdobe PDFThumbnail
View/Open
Show full item record
Review this work
 


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.