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Título

Secondary electron emission and photoemission studies on surface films of carbon nitride

AutorRipalda, José María ; Montero, Isabel ; Vázquez, Luis ; Raboso, D.; Galán, L.
Palabras claveFullerenes
Graphite
Diamond-like carbon
Nitrogen
Thin films
Secondary electron emission
Photoelectron spectra
Ion-surface impact
Fecha de publicación24-feb-2006
EditorAmerican Institute of Physics
CitaciónJournal of Applied Physics 99, 043513 (2006)
ResumenThe secondary electron emission yield of fullerene, graphite, and diamondlike carbon after low-energy N2+ ion bombardment was studied for antimultipactor applications. Nitrogen incorporation into the carbon thin films decreases their secondary emission yield, contrary to the hydrogen or oxygen effect. Carbon nitride surface textured to a nanometric scale had the property of hindering secondary electron emission. Valence bands obtained from photoemission spectroscopy using synchrotron radiation were correlated with secondary electron emission measurements. Multipactor threshold power for carbon nitride was 7.5 kW.
Versión del editorhttp://link.aip.org/link/?JAPIAU/99/043513/1
http://dx.doi.org/10.1063/1.2173307
URIhttp://hdl.handle.net/10261/18320
DOI10.1063/1.2173307
ISSN0021-8979
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