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Title

Atomic resolution analysis of microporous titanosilicate ETS-10 through aberration corrected STEM Imaging

AuthorsMayoral, Álvaro; Coronas, Joaquín; Casado, Clara; Téllez, Carlos; Díaz Carretero, Isabel
KeywordsMolecular sieves
Electron microscopy
Catalysis
Issue DateSep-2013
PublisherWiley-VCH
CitationCHEMCATCHEM 5(9): 2595-2598 (2013)
AbstractIt′s all your fault! Microporous titanosilicate ETS‐10 crystals have been analyzed by advanced electron microscopy techniques. With the last generation of spherical aberration corrected electron microscopes, truly atomic resolution images have been recorded. Owing to the extremely high‐resolution images that have been obtained, the multiple defects (stacking faults, lack of porosity and “double‐pores”) present in this type of material can be analyzed in great detail.
Publisher version (URL)https://doi.org/10.1002/cctc.201300045
URIhttp://hdl.handle.net/10261/183093
DOI10.1002/cctc.201300045
ISSN1867-3880
E-ISSN1867-3899
Appears in Collections:(ICP) Artículos
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