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dc.contributor.authorPablo-Navarro, Javier-
dc.contributor.authorMagen, Cesar-
dc.contributor.authorBerganza, Eider-
dc.contributor.authorJaafar, Miriam-
dc.contributor.authorAsenjo Barahona, Agustina-
dc.contributor.authorTeresa, José María de-
dc.date.accessioned2019-05-31T10:26:39Z-
dc.date.available2019-05-31T10:26:39Z-
dc.date.issued2018-
dc.identifier.citationFEBIP 2018-
dc.identifier.urihttp://hdl.handle.net/10261/183030-
dc.descriptionResumen del trabajo presentado al 7th International Workshop on Focused Electron Beam-Induced (FEBIP), celebrado en Modena (Italia) del 10 al 13 de julio de 2018.-
dc.relation.isversionofPublisher's version-
dc.rightsopenAccess-
dc.titleMagnetic Force Microscopy (MFM) probes by FEBID and their application-
dc.typecomunicación de congreso-
dc.date.updated2019-05-31T10:26:39Z-
dc.description.versionPeer Reviewed-
dc.language.rfc3066eng-
dc.relation.csic-
Appears in Collections:(ICMA) Comunicaciones congresos
(ICMM) Comunicaciones congresos
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