English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/182823
Share/Impact:
Statistics
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:

Title

Definitive Molecular Level Characterization of Defects in UiO-66 Crystals

AuthorsTrickett, Christopher A.; Gagnon, Kevin J.; Lee, Seungkyu; Gándara Barragán, Felipe ; Bürgi, Hans-Beat; Yaghi, Omar M.
KeywordsMetal‐organic frameworks
Structure elucidation
Single crystals
X‐ray diffraction
UiO‐66
Issue Date14-Sep-2015
PublisherJohn Wiley & Sons
CitationAngewandte Chemie - International Edition 54: 11162-11167 (2015)
AbstractThe identification and characterization of defects, on the molecular level, in metal‐organic frameworks (MOFs) remain a challenge. With the extensive use of single‐crystal X‐ray diffraction (SXRD), the missing linker defects in the zirconium‐based MOF UiO‐66, Zr6O4(OH)4(C8H4O4)6, have been identified as water molecules coordinated directly to the zirconium centers. Charge balancing is achieved by hydroxide anions, which are hydrogen bonded within the pores of the framework. Furthermore, the precise nature of the defects and their concentration can be manipulated by altering the starting materials, synthesis conditions, and post‐synthetic modifications.
URIhttp://hdl.handle.net/10261/182823
Identifiersdoi: 10.1002/anie.201505461
issn: 1433-7851
e-issn: 1521-3773
Appears in Collections:(ICMM) Artículos
Files in This Item:
File Description SizeFormat 
accesoRestringido.pdf15,38 kBAdobe PDFThumbnail
View/Open
Show full item record
Review this work
 

Related articles:


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.