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Quantitative transmission electron microscopy of advanced nanomaterials: Applications to multiferroic oxides and nanomagnetism

AuthorsMagén, César
Issue Date2018
CitationBIST Symposium on Microscopy, Nanoscopy, and Imaging Sciences (2018)
AbstractRecent trends in Nanoscience and Nanotechnology have evidenced the need for accurate quantitative nanocharacterization methods to determine the magnitude of fundamental physical properties of novel nanomaterials at the nanoscale. Nowadays the most advanced transmission electron microscopy techniques have reached unprecedented levels of resolution and sensitivity that that enables the quantitative analysis of the atomic structure, chemical composition, electronic or magnetic state of novel functional materials, in some cases with atomic resolution. In this lecture, I will review some applications of advanced TEM techniques, focusing on aberration corrected scanning transmission electron microscopy and off-axis electron holography, used to probe the structural, chemical, electronic and magnetic properties down to the atomic scale in the fields of the complex multiferroic oxides and nanomagnetism.
DescriptionResumen del trabajo presentado al BIST Symposium on Microscopy, Nanoscopy, and Imaging Sciences, celebrado en Castelldefels (España) el 9 de febrero de 2018.
Appears in Collections:(ICMA) Comunicaciones congresos
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