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dc.contributor.authorVera Londono, Liliana Patriciaes_ES
dc.contributor.authorRuiz-Clavijo, Alejandraes_ES
dc.contributor.authorPérez Taborda, Jaime Andréses_ES
dc.contributor.authorMartín-González, Marisoles_ES
dc.date.accessioned2019-05-20T13:09:51Z-
dc.date.available2019-05-20T13:09:51Z-
dc.date.issued2018-03-28-
dc.identifier.citation5th Thermal probe Workshop (2018)es_ES
dc.identifier.urihttp://hdl.handle.net/10261/181796-
dc.descriptionTrabajo presentado en el 5th Thermal probe Workshop, celebrado en Zurich (Suiza), los días 28 y 29 de marzo de 2018es_ES
dc.language.isoenges_ES
dc.rightsclosedAccesses_ES
dc.titleThermal conductivity measurements of nanostructures by scanning thermal microscopyes_ES
dc.typepóster de congresoes_ES
dc.description.peerreviewedPeer reviewedes_ES
dc.relation.csices_ES
oprm.item.hasRevisionno ko 0 false*
Appears in Collections:(IMN-CNM) Comunicaciones congresos
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