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d2Dplot: 2D X-ray diffraction data processing and analysis for through-the-substrate microdiffraction

AuthorsVallcorba, Oriol ; Rius, Jordi
Keywords2D X-ray diffraction
Through-the-substrate microdiffraction
Powder diffraction
Computer programs
Issue Date26-Mar-2019
PublisherInternational Union of Crystallography
CitationJournal of Applied Crystallography 52(2): 478-484 (2019)
AbstractThe d2Dplot computer program provides a set of tools for the visualization, processing and analysis of 2D X-ray diffraction (2DXRD) data. Among the operations available there are the sum/subtraction of 2DXRD images, conversion to 1D data (powder pattern), azimuthal plotting, calibration of instrumental parameters, background subtraction and a command-line mode to run operations inside data processing pipelines. The graphical user interface allows easy use of the program. It also includes two main features: (i) the possibility of creating a user compound database to help in the fast phase identification of similar samples, and (ii) a detailed peak analysis routine for the application of the through-the-substrate microdiffraction methodology.
Publisher version (URL)http://dx.doi.org/10.1107/S160057671900219X
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