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Título

Investigation of the multilevel capability of TiN/Ti/HfO2/W resistive switching devices by sweep and pulse programming

AutorPoblador, Samuel CSIC ORCID ; González, M. B.; Campabadal, Francesca CSIC ORCID
Fecha de publicación2018
EditorElsevier
CitaciónMicroelectronic Engineering 187-188: 148- 153 (2018)
ResumenMultilevel states are clearly distinguished in TiN/Ti/HfO/W RRAM devices by programming sequential voltage ramps and trains of pulses. It has been shown that the filamentary conductance has a continuous dependence on the current compliance employed during the SET process and the maximum voltage applied during the RESET process. The LRS conductance is determined by the current compliance, while the HRS is given by the RESET pulse amplitude. The obtained results suggest that the studied devices can be employed as electronic synaptic devices in neuromorphic circuits.
URIhttp://hdl.handle.net/10261/176024
DOI10.1016/j.mee.2017.11.007
Identificadoresdoi: 10.1016/j.mee.2017.11.007
issn: 0167-9317
Aparece en las colecciones: (IMB-CNM) Artículos




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