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Título: | Electromigration in the dissipative state of high-temperature superconducting bridges |
Autor: | Baumans, Xavier D.A.; Fernández Rodríguez, Alejandro; Mestres, Narcís CSIC ORCID ; Collienne, Simon; Van de Vondel, Joris; Palau, Anna CSIC ORCID; Silhanek, Alejandro V. | Palabras clave: | Superconductivity I-V characteristics Electromigration High temperature superconductors Resistive switching Electrical properties and parameters Thermodynamic states and processes |
Fecha de publicación: | 7-ene-2019 | Editor: | American Institute of Physics | Citación: | Applied Physics Letters 114(1): 012601 (2019) | Resumen: | The current stimulated atomic diffusion in YBa2Cu3O7–d superconducting bridges is investigated. A superconductor to insulator transition can be induced by the current controlled electromigration process, whereas the partial recovery of the superconducting state can be achieved by inverting the polarity of the bias. Interestingly, the temperature dependence of the current density JEM(T), above which atomic migration takes place, intersects the critical current density Jc(T) at certain temperature T*. Therefore, for T < T*, the current-induced dissipative state cannot be accessed without leading to irreversible modifications of the material properties. This phenomenon could also lead to the local deterioration of high critical temperature superconducting films abruptly penetrated by thermomagnetic instabilities. | Versión del editor: | http://dx.doi.org/10.1063/1.5063797 | URI: | http://hdl.handle.net/10261/175008 | ISSN: | 0003-6951 |
Aparece en las colecciones: | (ICMAB) Artículos |
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