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Title

Electromigration in the dissipative state of high-temperature superconducting bridges

AuthorsBaumans, Xavier D.A.; Fernández Rodríguez, Alejandro; Mestres, Narcís ; Collienne, Simon; Van de Vondel, Joris; Palau, Anna ; Silhanek, Alejandro V.
KeywordsSuperconductivity
I-V characteristics
Electromigration
High temperature superconductors
Resistive switching
Electrical properties and parameters
Thermodynamic states and processes
Issue Date7-Jan-2019
PublisherAmerican Institute of Physics
CitationApplied Physics Letters 114(1): 012601 (2019)
AbstractThe current stimulated atomic diffusion in YBa2Cu3O7–d superconducting bridges is investigated. A superconductor to insulator transition can be induced by the current controlled electromigration process, whereas the partial recovery of the superconducting state can be achieved by inverting the polarity of the bias. Interestingly, the temperature dependence of the current density JEM(T), above which atomic migration takes place, intersects the critical current density Jc(T) at certain temperature T*. Therefore, for T < T*, the current-induced dissipative state cannot be accessed without leading to irreversible modifications of the material properties. This phenomenon could also lead to the local deterioration of high critical temperature superconducting films abruptly penetrated by thermomagnetic instabilities.
Publisher version (URL)http://dx.doi.org/10.1063/1.5063797
URIhttp://hdl.handle.net/10261/175008
ISSN0003-6951
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